MP-P100 E

The MP-P100 E is a robust spring-loaded test probe featuring a 1.5mm outer diameter plunger with a 90° tip configuration. Designed for precision PCB testing applications, it delivers consistent mechanical performance and stable electrical contact in ICT fixtures, functional testing systems, and production environments. The MP-P100 E combines a durable gold-plated structure with a 90° plunger tip, making it well suited for applications requiring firm, repeatable contact on flat or angled test points. Ideal for high-cycle testing environments where precision and reliability are essential.

• Plunger: Full-hard Beryllium Copper, gold-plated over nickel for excellent conductivity, wear resistance, and corrosion protection
• Barrel: Gold-plated brass for durability and long service life
• Spring: Stainless steel to maintain consistent contact force
• Receptacle: Gold-plated brass ensuring secure, low-resistance termination
• Recommended minimum centre spacing: 2.54mm (100mil)
• Full travel: 6.30mm
• Spring pressure (+20% tolerance): 150g / 250g
• Current rating: 3A continuous
• Contact resistance: ≤ 50m
• Mounting hole size: Ø1.75mm

應用

Automated Test Equipment, Test & Measurement, Electronics Design, Electronics Service, Industrial Automation, Manufacturing, Quality Control, Prototyping, Semiconductor, Research & Development