MP-P100 U1

The MP-P100 U1 is a precision spring-loaded test probe featuring a fine 0.35mm plunger with a 50° tip configuration. Designed for accurate contact on small test pads and fine features, it is suitable for PCB in-circuit testing (ICT), functional verification, and production test fixtures requiring controlled force and repeatable engagement. With its fine 0.35mm 50° tip and robust gold-plated construction, the MP-P100 U1 test probe is well suited for high-precision test environments where accuracy, durability, and consistent electrical performance are essential.

• Plunger: Full-hard Beryllium Copper, gold-plated over nickel for excellent electrical performance and long mechanical life
• Barrel: Gold-plated brass providing corrosion resistance and durability
• Spring: Stainless steel for stable and consistent contact force
• Receptacle: Gold-plated brass for secure, low-resistance connections
• Recommended minimum centre spacing: 2.54mm (100mil)
• Full travel: 6.30mm
• Spring pressure (+20% tolerance): 150g / 250g
• Current rating: 3A continuous
• Contact resistance: ≤ 50mΩ
• Mounting hole size: Ø1.75mm

應用

Automated Test Equipment, Test & Measurement, Electronics Design, Electronics Service, Industrial Automation, Manufacturing, Quality Control, Prototyping, Semiconductor, Research & Development