MP-P50 D

The MP-P50 D is a precision spring-loaded test probe engineered for reliable electrical contact in PCB testing, in-circuit testing (ICT), and functional verification applications. Featuring a 0.6mm outer diameter plunger and Ø0.9mm mounting requirement, this probe is suitable for high-density layouts while maintaining stable mechanical and electrical performance. With gold-plated contact surfaces and high-quality spring construction, the MP-P50 D delivers low contact resistance, consistent spring force, and dependable long-term operation in production and development environments.

• Compact 0.6mm OD plunger for dense PCB designs
• Gold-plated contact surfaces for enhanced conductivity and corrosion resistance
• Consistent 80g spring force for stable electrical contact
• 3A continuous current rating
• Designed for fixture-based and automated testing systems
• Plunger: Full-hard Beryllium Copper, gold-plated over nickel
• Barrel: Brass, gold-plated
• Spring: Stainless steel
• Receptacle: Brass, gold-plated

應用

Automated Test Equipment, Test & Measurement, Electronics Design, Electronics Service, Industrial Automation, Manufacturing, Quality Control, Prototyping, Semiconductor, Research & Development