973972101

Miniature clamp-type test probe with rotating grip jaws (SMD technology). The insulated shaft can be bent up to 35º. Suitable for very thin wires and densely packed contact points (1.27 mm IC spacing pitch). Connects with MKL... and MAL...

• 0.64 mm system
• Clamp-type test probe
• 30 VAC / 60 VDC rated voltage (1)
• O (3) measurement cat. acc. to IEC 61010
• 2 A rated current (1)
• PBT housing material
• (1) for normal environmental conditions -5°C to +40°C
• (3) without rated measurement category, for other circuits that are not directly connected to mains
• Temperature range: -25°C to +100°C
• Contact material: grip jaws: spring steel, pin: brass
• Contact surface material: grip jaws: tin, pin: nickel
• Housing (basic material): UL 94 HB