MP-P100 D

The MP-P100 D is a precision-engineered spring-loaded test probe featuring a 1.5mm outer diameter plunger with a 30° tip design. It is developed for dependable electrical contact in PCB test fixtures, in-circuit testing (ICT), and functional verification applications where accurate alignment and consistent pressure are required. The MP-P100 D combines a robust gold-plated construction with a 30° plunger tip for accurate contact engagement, making it ideal for production testing environments that demand repeatability, durability, and dependable electrical performance.

• Plunger: Full-hard Beryllium Copper, gold-plated over nickel for superior conductivity, durability, and corrosion resistance
• Barrel: Gold-plated brass for long-term reliability
• Spring: Stainless steel to ensure stable mechanical performance
• Receptacle: Gold-plated brass for secure, low-resistance connections
• Recommended minimum centre spacing: 2.54mm (100mil)
• Full travel: 6.30mm
• Spring pressure (+20% tolerance): 150g / 250g
• Current rating: 3A continuous
• Contact resistance: ≤ 50mΩ
• Mounting hole size: Ø1.75mm

應用

Automated Test Equipment, Test & Measurement, Electronics Design, Electronics Service, Industrial Automation, Manufacturing, Quality Control, Prototyping, Semiconductor, Research & Development