MP-P100 J

The MP-P100 J is a high-performance spring-loaded test probe designed for reliable electrical contact in PCB test fixtures and automated test equipment. With a 1.02mm outer diameter plunger and robust internal construction, it delivers consistent performance in demanding production and inspection environments. The MP-P100 J test probe is ideal for functional testing, in-circuit testing (ICT), and production-line validation where durability, precision, and repeatable electrical performance are essential.

• Durable Contact Materials
• Optimised for 2.54mm (100mil) Pitch Applications
• Extended Travel & Controlled Force
• Full travel: 6.30mm
• Spring pressure (+20% tolerance): 150g / 250g
• Current rating: 3A continuous
• Contact resistance: ≤ 50mΩ
• Mounting hole size: Ø1.75mm

應用

Automated Test Equipment, Test & Measurement, Electronics Design, Electronics Service, Industrial Automation, Manufacturing, Quality Control, Prototyping, Semiconductor, Research & Development