MP-P100 V

The MP-P100 V is a durable spring-loaded test probe featuring a 1.5mm outer diameter plunger with a 35° tip configuration. Engineered for precision PCB testing, it provides reliable mechanical engagement and stable electrical contact in ICT fixtures, functional testing systems, and production environments. With its 35° plunger tip and robust gold-plated construction, the MP-P100 V is ideal for high-cycle testing applications requiring consistent performance, mechanical durability, and dependable electrical conductivity.

• Plunger: Full-hard Beryllium Copper, gold-plated over nickel for excellent conductivity, wear resistance, and corrosion protection
• Barrel: Gold-plated brass for enhanced durability and long service life
• Spring: Stainless steel ensuring consistent and repeatable contact force
• Receptacle: Gold-plated brass for secure, low-resistance termination
• Recommended minimum centre spacing: 2.54mm (100mil)
• Full travel: 6.30mm
• Spring pressure (+20% tolerance): 150g / 250g
• Current rating: 3A continuous
• Contact resistance: ≤ 50mΩ
• Mounting hole size: Ø1.75mm

應用

Automated Test Equipment, Test & Measurement, Electronics Design, Electronics Service, Industrial Automation, Manufacturing, Quality Control, Prototyping, Semiconductor, Research & Development