MP-P50 A1

The MP-P50 A1 is a precision 90° spring-loaded test probe designed for reliable PCB testing, in-circuit testing (ICT), and functional test fixtures. With a 0.5mm outer diameter plunger and compact footprint, it is ideal for high-density board layouts where space is limited and consistent electrical contact is critical. Manufactured using high-quality materials and gold-plated contact surfaces, the MP-P50 A1 ensures low contact resistance, excellent conductivity, and long operational life in demanding production environments.

• 90° plunger configuration for right-angle access
• Gold-plated contacts for superior conductivity and corrosion resistance
• Compact design suitable for high-density PCB layouts
• Stable spring force for consistent electrical contact
• Rated for 3A continuous current
• Plunger: Full-hard Beryllium Copper, gold-plated over nickel
• Barrel: Brass, gold-plated
• Spring: Stainless steel
• Receptacle: Brass, gold-plated

應用

Automated Test Equipment, Test & Measurement, Electronics Design, Electronics Service, Industrial Automation, Manufacturing, Quality Control, Prototyping, Semiconductor, Research & Development