MP-P50 T

The MP-P50 T is a precision 90° spring-loaded test probe engineered for reliable electrical contact in PCB testing, in-circuit testing (ICT), and functional test fixtures. With a 0.9mm outer diameter plunger and right-angle configuration, it is ideally suited for applications where horizontal access, edge probing, or limited vertical clearance is required. Designed for durability and consistent performance, the MP-P50 T features gold-plated contact surfaces to ensure low contact resistance, stable conductivity, and long operational life in both development and high-volume production environments.

• 90° plunger design for right-angle and edge-access testing
• 0.9mm OD plunger for enhanced mechanical stability
• Gold-plated contact surfaces for optimal conductivity and corrosion resistance
• Consistent 80g spring force for reliable electrical contact
• 3A continuous current rating
• Plunger: Full-hard Beryllium Copper, gold-plated over nickel
• Barrel: Brass, gold-plated
• Spring: Stainless steel
• Receptacle: Brass, gold-plated

應用

Automated Test Equipment, Test & Measurement, Electronics Design, Electronics Service, Industrial Automation, Manufacturing, Quality Control, Prototyping, Semiconductor, Research & Development