MP-P50 V

The MP-P50 V is a precision spring-loaded test probe designed to deliver stable, low-resistance electrical contact in PCB testing, in-circuit testing (ICT), and functional verification applications. Featuring a 0.9mm outer diameter plunger with a 0.7mm tip profile, this probe provides enhanced mechanical stability while maintaining suitability for fine-pitch and high-density layouts. Engineered for consistent performance in demanding production and development environments, the MP-P50 V combines high-quality materials with gold-plated contact surfaces to ensure reliable conductivity and long operational life.

• 0.9mm OD plunger for robust mechanical performance
• 0.7mm tip profile for accurate PCB pad contact
• Gold-plated contacts for superior conductivity and corrosion resistance
• Stable 80g spring force for consistent electrical connection
• Rated for 3A continuous current
• Plunger: Full-hard Beryllium Copper, gold-plated over nickel
• Barrel: Brass, gold-plated
• Spring: Stainless steel
• Receptacle: Brass, gold-plated

應用

Automated Test Equipment, Test & Measurement, Electronics Design, Electronics Service, Industrial Automation, Manufacturing, Quality Control, Prototyping, Semiconductor, Research & Development