MP-P50 G

The MP-P50 G is a robust, precision-engineered spring-loaded test probe designed for dependable electrical contact in PCB testing, in-circuit testing (ICT), and functional test fixtures. With a larger 0.9mm outer diameter plunger, this probe provides enhanced mechanical stability while maintaining suitability for 1.27mm (50 mil) pitch applications. Engineered for consistent performance in demanding production environments, the MP-P50 G combines high-quality materials with gold-plated contact surfaces to ensure low contact resistance, excellent conductivity, and extended operational life.

• 0.9mm OD plunger for increased mechanical stability
• Gold-plated contact surfaces for optimal conductivity and corrosion resistance
• Stable 80g spring force for reliable electrical connection
• 3A continuous current rating
• Designed for automated and fixture-based PCB testing
• Plunger: Full-hard Beryllium Copper, gold-plated over nickel
• Barrel: Brass, gold-plated
• Spring: Stainless steel
• Receptacle: Brass, gold-plated

應用

Automated Test Equipment, Test & Measurement, Electronics Design, Electronics Service, Industrial Automation, Manufacturing, Quality Control, Prototyping, Semiconductor, Research & Development