MP-P50 G1

The MP-P50 G1 is a compact, high-precision spring-loaded test probe designed for reliable electrical contact in PCB testing, in-circuit testing (ICT), and functional test applications. Featuring a slim 0.5mm outer diameter plunger, it is well suited for high-density board layouts while maintaining consistent mechanical and electrical performance. Gold-plated contact surfaces and premium spring materials ensure low contact resistance, stable conductivity, and long service life in both development and high-volume production environments.

• Slim 0.5mm OD plunger for dense PCB designs
• Gold-plated contacts for enhanced conductivity and corrosion resistance
• Consistent 80g spring force for stable electrical connection
• 3A continuous current rating
• Suitable for automated and fixture-based test systems
• Plunger: Full-hard Beryllium Copper, gold-plated over nickel
• Barrel: Brass, gold-plated
• Spring: Stainless steel
• Receptacle: Brass, gold-plated

應用

Automated Test Equipment, Test & Measurement, Electronics Design, Electronics Service, Industrial Automation, Manufacturing, Quality Control, Prototyping, Semiconductor, Research & Development