MP-P50 J

The MP-P50 J is a precision-engineered spring-loaded test probe designed for consistent and reliable electrical contact in PCB testing applications. With a 0.5mm outer diameter plunger, this probe is ideal for high-density circuit boards and compact test fixture designs requiring accurate, repeatable contact performance. Manufactured using high-grade materials and finished with gold-plated contact surfaces, the MP-P50 J ensures low contact resistance, strong conductivity, and extended operational life in both prototype validation and high-volume production environments.

• Compact 0.5mm OD plunger for dense PCB layouts
• Gold-plated contact surfaces for optimal conductivity and corrosion resistance
• Stable 80g spring force for consistent contact pressure
• 3A continuous current capability
• Suitable for automated and manual test fixtures
• Plunger: Full-hard Beryllium Copper, gold-plated over nickel
• Barrel: Brass, gold-plated
• Spring: Stainless steel
• Receptacle: Brass, gold-plated

應用

Automated Test Equipment, Test & Measurement, Electronics Design, Electronics Service, Industrial Automation, Manufacturing, Quality Control, Prototyping, Semiconductor, Research & Development